Ic Engineer Interview Questions

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Discussions on DFT - seemed like the interviewer was looking for the 2 terms i.e., controllability and observability Can scan chains run on functional clk and data pins. Lock up latches usage in DFT Boundary Scan Design and TAP Controller
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Senior IC Design Engineer

Interviewed at Xilinx

4.2
Jul 16, 2018

Discussions on DFT - seemed like the interviewer was looking for the 2 terms i.e., controllability and observability Can scan chains run on functional clk and data pins. Lock up latches usage in DFT Boundary Scan Design and TAP Controller

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